Jerzy Kanicki, Ph.D.
734-936-0964
kanicki@eecs.umich.edu

Jerzy Kanicki received his Ph. D. degree in Sciences (D. Sc.) from the Free University of Brussels (Université Libre de Bruxelles), Brussels, Belgium, in 1982. He subsequently joined the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, as a Research Staff Member working on hydrogenated amorphous silicon devices for the photovoltaic and flat panel display applications. In 1994 he moved from IBM Research Division to the University of Michigan as a Professor in the Department of Electrical Engineering and Computer Science. At the present, his research interests within the Electrical and Computer Engineering (ECE) division of EECS, include organic electronics, thin-film transistors and circuits, and flat panel displays technology including organic light-emitting devices.

Alex Kuo
(734)-936-0972
alex.c.kuo@gmail.com

My project focuses on the characterization and optimization of the next generation disordered semiconductor for display and detector application. I’m currently investigating the underlying device physics of amorphous indium-gallium-zinc-oxide thin-film-transistor (a-IGZO TFT). This material has some unique electrical characteristics that are different from conventional disordered semiconductor. By having a good understanding of the conduction mechanism, thermal and electrical stability, and optical-electronic behavior, we can harness its high electrical performance when designing circuits for displays and detectors. I received my B.S. in electrical engineering and computer science from University of California Berkeley, M.S., and Ph.D. in electrical engineering and computer science from the University of Michigan.

Gwanghyeon Baek
734-936-0972
gbaek@umich.edu

I am mainly focusing on developing a pixel circuit and physical design for image sensors with Thin-Film Transistors (TFTs). We hope to achieve high resolution imager having wide dynamic range and small pixel pitch. We extract Spice parameters from fabricated TFTs and develop imager array based on these parameters. I received B.S degree in Physics from Korea University, Seoul, Korea in 2002 and M.S. degree in EE from Seoul National University, Seoul, Korea in 2004. From 2004 to 2007, I was with Samsung Electronics, Giheung, Korea as an engineer.

Charlene Chen
734-936-0972
charchic@umich.edu

My research mainly focuses on amorphous In-Ga-Zn-O (a-IGZO) thin film transistors (TFTs). Besides basic electrical characterizations, we are also performing temperature and current stress measurements to evaluate its stability. We hope to develop a better understanding of the properties of the a-IGZO TFTs and explore the possibilities of applying them to the backplane pixel circuit of active-matrix organic light-emitting displays (AMOLEDs). I received my B.S. degree in EE from National Taiwan University in 2005, and M.S. in EE from the University of Michigan in 2006.

Dennis Feng
734-936-0972
dfeng@umich.edu

My summer research focuses on characterizing and simulating thin film transistors (TFT). I use UTMOST to extract SPICE parameters from different IV curves of a-IGZO TFTs measured in lab. I have developed two C++ programs to convert raw data into a UTMOST usable format. I use SIMCAD Gateway to simulate a variety of pixel circuits using TFT parameters characterized in UTMOST. I am currently investigating the AC characteristics of a-IGZO TFTs. I received my B.S. degree in Electrical Engineering from the University of Michigan in 2008 and I am currently enrolled in the Masters degree program

Tze-Ching (Richard) Fung
734-936-0972
tcfung@umich.edu

My research project focuses on science and technology related to oxide semiconductor thin-film transistors (OS-TFTs). More specifically, we studied the optical properties of oxide semiconductor thin-film, electrical/optoelectrical properties of OS-TFTs, device modeling and related processing technology. The long term goal for the project is to develop proper architecture for OS-TFTs to be used in high performance flat-panel display or photo imager. I am also interested in low level electrical measurement and other testing technologies for semiconductor devices. I received my B.S. in Physics from National Taiwan University in 2001, my M.S. in EE from University of Michigan in 2005, and am currently a doctoral candidate in the EECS department.

Geonwook Yoo
734-936-0972
gwyoo@umich.edu

My project focuses on demonstrating image sensor on a curved surface with a wide dynamic range and a large field of view (FOV). Specifically, we design, simulate and make layouts of passive and active pixel sensor circuit with thin-film transistor (TFT) using HSPICE and Cadence. We also develop innovative processes needed to fabricate the pixel circuits on a curved surface. In the long term goal, we hope to show an image sensor of million pixels and a wide FOV on a curved surface. I received my B.S. in EE from Korea University, and M.Eng in BME from Cornell University, and I am currently a doctoral candidate in the EECS. I joined the group in August 2007.

Internships