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Prerequisite: |
EECS 478 or Instructor's consent. |
Text Book: |
M. Bushnell, and V. D. Agarwal, Essential of Electronic Testing for Digital, Memory and Mixed Signal VLSI Circuits , Kluwer Aacdemic Press,, Boston , 2000, 690 pages |
Supplementary Text Book: |
1. P. Mazumder and K.Chakraborty, Testing and Testable Design of Random-Access
Memories, Kluwer Academic Publishers, New York, 1996, 430 pages. |
| : | 2. M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital System Testing and Testable Design, IEEE Press, New York, 1990, 652 pages (an early version of the same book was published by Computer Science Press). |
Evaluation: |
1. Homework Assignments(6): 30% 2. Project: 30% 3. Midterm(2): 20% 4. Final Exam: 20%. |
Class Handouts Course
Announcement
Detailed Course
Outline
List of Projects
Schedule
Lecture Materials Lectures #1&2: Preliminary issues of VLSI chip testing
Lectures #2&3:Test economics, test quality and yield analysis
Lectures #4&5:Fault models, fault collapsing and logic simulation
Lectures #6:Testing of basic gates and parity tree based gated networks
Lectures #7 & 8:Combinational circuit testing
Lectures #9 & 10:Algorithms for combinational circuit testing
Lectures #11 & 12:PODEM and FAN
Lectures #13 & 14:Testability and SCOAP
Lectures #15 & 16:Fault Simulation
Lectures
#17 & 18:Memory testing
Lectures
#19 & 20:Built-in Self-Testing and LFSR Theory
Homework Assignments Homework assignment #1: Chapters 1, 2 and 3. (Textbook)
Homework assignment #2: Chapter 4: Fault Modeling
Other Links and Resources EECS 427: VLSI Design
I EECS 470: Computer
Architecture EECS 627: VLSI Design
II The University of California, Berkeley, SPICE3 Electrical engineering Virtual Library.
UNIX Reference Desk. |