Copyright 2015 Euisik Yoon

Professor Euisik Yoon

Patents

Patents:

 

1.    E. Yoon and S.-I. Chang, “Bioamplifier for Neural Interface,” US Patent #8,922,274, Dec. 30, 2014.

2.    E. Yoon and S.-I. Chang, “Low-Power Area-Efficient SAR ADC Using Dual Capacitor Arrays,” US Patent #8,797,204, Aug. 5, 2014.

3.    E. Yoon and Y.-J. Kim, “Microfluidic Platform for Discrete Cell Array,” US Patent #8,747,776, Jun. 10, 2014.

4.    J. Choi and E. Yoon, “Image sensor with high dynamic range imaging and integrated motion detection,” US Patent#8,619,168, Dec. 31, 2013.

5.    J. Choi and E. Yoon, “Spatial-Temporal Multi-Resolution Image Sensor with Adaptive Frame Rates for Tracking Movement in a Region of Interest,” US Patent#8,089,522, Jan 3, 2012.

6. E. Yoon and H.-K. Lee, “Flexible Modular Sensor Systems,” US Patent#7,673,528, March 9, 2010.

7. S. Kang, M. Kim, E. Yoon, H.-K. Lee, S.-I. Chang and J. Choi, “Capacitive Sensor for Sensing Tactile and Proximity and a Sensing System Using the Same,” US Patent#7,679,376, March 16, 2010.

8.    K.-S. Yun and E. Yoon, “Microfluidic Chip for High-Throughput Screening and High-Throughput Assay,” US Patent#7,544,707, 2009.

9.    K.-H. Lee and E. Yoon, “ CMOS Image Sensor,” U.S. Patent #7,375,751, 2008.

10. S.-J. Kim and E. Yoon, “Capacitance-type Fingerprint Sensor,” U.S. Patent #7,298,875, 2007.

11. E. Yoon and E.-C. Park, “High Frequency Distributed Oscillator Using Coupled Transmission Line,” KAIST, U.S. Patent #7,161,441, 2007.

12. I.-J. Cho, E.-C. Park, S. Hong and E. Yoon, “Method of Fabricated Probe for Scanning Probe Microscope,” KAIST, U.S. Patent #7,119,332, 2006.

13. I.-J. Cho, K.-S. Yun, E. Yoon, "Electromagnetically Actuated Micromirror Actuator and Fabrication Method Thereof," KAIST, U.S. Patent #6,781,732, 2004.

14.    E. Yoon, J.-B. Yoon, H.-K. Lee, J.-H. Kim, "Micromirror Actuator," KAIST, U.S. Patent #6,775,050, 2004.

15.    E. Yoon and K.-S. Yun, “Micropump Driven by Movement of Liquid Drop Induced by Continuous Electrowetting,” KAIST, U.S. Patent #6,629,826, 2003.

16.    E.-C. Park, J.-B. Yoon, and E. Yoon, "Sealed-type Remote Pressure-Monitoring Device Method for Fabricating the Same," KAIST, U.S. Patent #6,517,483, 2003.

17.    J.-B. Yoon, C.-H. Han, E. Yoon, C.-H. Kim, "Method for manufaturing a semiconductor device having a metal layer floating over a substrate," KAIST, U.S. Patent #6518165, 2003

18. E. Yoon, K.-H. Lee, and H.-K. Lee, “Electrothermal Integrator and Audio Frequency Filter,” KAIST, U.S. Patent #6,462,614, 2002.

19. E. Yoon, E.-C. Park, and J.-B. Yoon, “Sealed-type Remote Pressure-Monitoring Device Method for Fabricating the Same,” KAIST, U.S. Patent #6,287,256, 2001.

20. N. Yeung, E. Pak, C.-C. Chao, and E. Yoon, "Apparatus and Method for Determining the Speed of a Semiconductor Chip,” Silicon Graphics Inc. U.S. Patent #5,818,250, 1998.

21. E. Yoon, R. P. Kovacs, and M. E. Thomas "Method of Providing A Dielectric Structure Semiconductor Devices,” National Semiconductor Corporation, U.S. Patent #5,688,724, 1997.

22. E. Yoon, R. Kovacs, and R. Allison "Photolithography Control System and Method Using Latent Image Measurements,” National Semiconductor Corporation," U.S. Patent #5,338,630, 1994.

23. E. Yoon, A. Bergemont, and R. Kovacs "Advanced Self-Aligned Stacked Gate EPROM Cells Using Tantalum Oxide Control Gate Dielectric,” National Semiconductor Corporation, U.S. Patent #5,304,503, 1994.  

24. E. Yoon, R. Kovacs, and R. Allison "Phase Contrast Latent Image Metrology Microlithography,” National Semiconductor Corporation, U.S. Patent #5,283,141, 1994.

 

 

 

 

College of Engineering

Electrical Engineering and Computer Science

 

University of Michigan